The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2014

Filed:

May. 06, 2011
Applicants:

Bob Streefkerk, Tilburg, NL;

Johannes Jacobus Matheus Baselmans, Oirschot, NL;

Adrianus Franciscus Petrus Engelen, Waalre, NL;

Jozef Maria Finders, Veldhoven, NL;

Paul Graeupner, Aalen, DE;

Johannes Catharinus Hubertus Mulkens, Waalre, NL;

Jan Bernard Plechelmus Van Schoot, Eindhoven, NL;

Assignees:

ASML Netherlands B.V., Veldhoven, NL;

Carl Zeiss SMT AG, Oberkochen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/42 (2006.01); G03B 27/52 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an immersion lithography apparatus or device manufacturing method, the position of focus of the projected image is changed during imaging to increase focus latitude. In an embodiment, the focus may be varied using the liquid supply system of the immersion lithographic apparatus.


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