The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 04, 2012

Filed:

Dec. 27, 2007
Applicants:

Siu Keung Kwok, Hong Kong, CN;

Chi Fai Cheung, Hong Kong, CN;

Hing Choi Tsang, Hong Kong, CN;

Wing Bun Lee, Hong Kong, CN;

Burly K. Tan, Hong Kong, CN;

Pui Him NG, Hong Kong, CN;

Sze Kit Ho, Hong Kong, CN;

Inventors:

Siu Keung Kwok, Hong Kong, CN;

Chi Fai Cheung, Hong Kong, CN;

Hing Choi Tsang, Hong Kong, CN;

Wing Bun Lee, Hong Kong, CN;

Burly K. Tan, Hong Kong, CN;

Pui Him Ng, Hong Kong, CN;

Sze Kit Ho, Hong Kong, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04Q 5/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for optimizing the deployment of RFID apparatus, and a RFID deployment optimizer of use thereof are provided. The method includes the steps: A. analyzing the interrogation zone where the RFID apparatus are deployed, B. identifying the readability o RFID tag associated with different sets of placement on a target object inside the interrogation zone, and C. selecting the best deployment alternative based on the analysis result of the interrogation zone attained in the step A and all the readabilities of RFID tag associated with different sets of placement identified in the step B.


Find Patent Forward Citations

Kwok, Siu. (2012). Method for optimizing rfid deployment and rfid deployment optimizer of use thereof (U.S. Patent No. 8325012). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8325012

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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