Hong Kong, China

Siu Keung Kwok

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Polyu Technology and Consultancy Company Limited. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Siu Keung Kwok. Retrieved from https://idiyas.com/inventor/siu-keung-kwok

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Siu Keung Kwok: Innovator in RFID Technology

Introduction

Siu Keung Kwok is a notable inventor based in Hong Kong, CN. He has made significant contributions to the field of RFID technology. His innovative approach has led to the development of a unique method for optimizing RFID deployment.

Latest Patents

Siu Keung Kwok holds 1 patent. His patent, titled "Method for optimizing RFID deployment and RFID deployment optimizer of use thereof," provides a comprehensive method for enhancing the deployment of RFID apparatus. The method includes analyzing the interrogation zone where RFID apparatus are deployed, identifying the readability of RFID tags associated with different sets of placements on a target object, and selecting the best deployment alternative based on the analysis results.

Career Highlights

Siu Keung Kwok is currently associated with PolyU Technology and Consultancy Company Limited. His work focuses on advancing RFID technology and improving its practical applications in various industries.

Collaborations

Siu Keung Kwok collaborates with Wing Bun Lee, contributing to the development of innovative solutions in RFID technology.

Conclusion

Siu Keung Kwok's contributions to RFID technology exemplify his commitment to innovation and excellence. His work continues to influence the field and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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