Hong Kong, China

Pui Him Ng

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Polyu Technology and Consultancy Company Limited. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Pui Him Ng. Retrieved from https://idiyas.com/inventor/pui-him-ng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Pui Him Ng: Innovator in RFID Technology

Introduction

Pui Him Ng is a notable inventor based in Hong Kong, CN. He has made significant contributions to the field of Radio Frequency Identification (RFID) technology. His innovative approach focuses on optimizing the deployment of RFID systems, which has practical applications in various industries.

Latest Patents

Pui Him Ng holds 1 patent for his invention titled "Method for optimizing RFID deployment and RFID deployment optimizer of use thereof." This patent outlines a method that includes analyzing the interrogation zone where RFID apparatus are deployed, identifying the readability of RFID tags associated with different sets of placements on a target object, and selecting the best deployment alternative based on the analysis results.

Career Highlights

Pui Him Ng is associated with the PolyU Technology and Consultancy Company Limited, where he applies his expertise in RFID technology. His work has contributed to advancements in how RFID systems are utilized in real-world applications.

Collaborations

Pui Him Ng collaborates with Wing Bun Lee, enhancing the innovative efforts within their field. Their partnership exemplifies the importance of teamwork in driving technological advancements.

Conclusion

Pui Him Ng's contributions to RFID technology demonstrate his commitment to innovation and optimization in this critical area. His work continues to influence the deployment of RFID systems, showcasing the potential for further advancements in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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