Hong Kong, China

Wing Bun Lee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Polyu Technology and Consultancy Company Limited. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Wing Bun Lee. Retrieved from https://idiyas.com/inventor/wing-bun-lee-4upn0gg9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Wing Bun Lee: Innovator in RFID Technology

Introduction

Wing Bun Lee is a notable inventor based in Hong Kong, CN. He has made significant contributions to the field of radio-frequency identification (RFID) technology. His innovative approach has led to the development of a method that optimizes the deployment of RFID apparatus.

Latest Patents

Wing Bun Lee holds 1 patent for his invention titled "Method for optimizing RFID deployment and RFID deployment optimizer of use thereof." This patent outlines a method that includes several steps: analyzing the interrogation zone where RFID apparatus are deployed, identifying the readability of RFID tags associated with different sets of placement on a target object inside the interrogation zone, and selecting the best deployment alternative based on the analysis results.

Career Highlights

Wing Bun Lee is currently associated with PolyU Technology and Consultancy Company Limited. His work focuses on enhancing the efficiency and effectiveness of RFID systems, which are crucial in various industries.

Collaborations

He has collaborated with notable coworkers, including Hing Choi Tsang and Siu Keung Kwok, who contribute to the innovative environment at his workplace.

Conclusion

Wing Bun Lee's contributions to RFID technology exemplify the impact of innovative thinking in optimizing technological applications. His work continues to influence the field and improve the deployment of RFID systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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