The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 13, 2012

Filed:

Apr. 28, 2011
Applicants:

Jaeseok Lee, Wilmington, DE (US);

Yi Guo, Newark, DE (US);

Kancharla-arun Kumar Reddy, Bear, DE (US);

Guangyun Zhang, Furlong, PA (US);

Inventors:

Jaeseok Lee, Wilmington, DE (US);

Yi Guo, Newark, DE (US);

Kancharla-Arun Kumar Reddy, Bear, DE (US);

Guangyun Zhang, Furlong, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/306 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for chemical mechanical polishing of a substrate comprising a germanium-antimony-tellurium chalcogenide phase change alloy (GST) using a chemical mechanical polishing composition consisting essentially of, as initial components: water; an abrasive; a material selected from ethylene diamine tetra acetic acid and salts thereof; and an oxidizing agent; wherein the chemical mechanical polishing composition facilitates a high GST removal rate with low defectivity.


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