The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8287331 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 16, 2012

Filed:

Apr. 01, 2008
Applicants:

Koichi Kanaya, Tokyo, JP;

Masayoshi Sekizawa, Niigata, JP;

Naotaka Toyama, Gunma, JP;

Inventors:

Koichi Kanaya, Tokyo, JP;

Masayoshi Sekizawa, Niigata, JP;

Naotaka Toyama, Gunma, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 37/04 (2012.01); B24B 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is disclosed a method for manufacturing a polishing pad that is formed of a urethane foam pad and attached to a turn table to polish a wafer, the method comprising at least steps of: slicing a urethane foam cake to provide the urethane foam pad; and performing press processing with respect to the urethane foam pad with a pressure of 15000 g/cmor above, a polishing pad manufactured by this method, and a method for polishing a wafer by using this polishing pad. There can be provided a method for manufacturing a polishing pad that can stably obtain a wafer with high flatness, etc.


Find Patent Forward Citations

Kanaya, Koichi. (2012). Method for manufacturing polishing pad, and method for polishing wafer (U.S. Patent No. 8287331). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8287331

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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