The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2011
Filed:
Oct. 13, 2008
Yung-chin Hou, Taipei, TW;
Ying-chou Cheng, Sijhih, TW;
Ru-gun Liu, Hsinchu, TW;
Chih-ming Lai, Hsinchu, TW;
Yi-kan Cheng, Taipei, TW;
Chung-kai Lin, Taipei, TW;
Hsiao-shu Chao, Taipei, TW;
Ping-heng Yeh, Tainan County, TW;
Min-hong Wu, Nantou County, TW;
Yao-ching Ku, Hsinchu, TW;
Tsong-hua Ou, Taipei, TW;
Yung-Chin Hou, Taipei, TW;
Ying-Chou Cheng, Sijhih, TW;
Ru-Gun Liu, Hsinchu, TW;
Chih-Ming Lai, Hsinchu, TW;
Yi-Kan Cheng, Taipei, TW;
Chung-Kai Lin, Taipei, TW;
Hsiao-Shu Chao, Taipei, TW;
Ping-Heng Yeh, Tainan County, TW;
Min-Hong Wu, Nantou County, TW;
Yao-Ching Ku, Hsinchu, TW;
Tsong-Hua Ou, Taipei, TW;
Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;
Abstract
Disclosed is a system and method for integrated circuit designs and post layout analysis. The integrated circuit design method includes providing a plurality of IC devices with various design dimensions; collecting electrical performance data of the IC devices; extracting equivalent dimensions of the IC devices; generating a shape related model to relate the equivalent dimensions to the electrical performance data of the IC devices; and creating a data refinement table using the equivalent dimensions and the electrical performance data.