The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 15, 2005

Filed:

Aug. 01, 2003
Applicants:

Justin K. Brask, Portland, OR (US);

Mark L. Doczy, Beaverton, OR (US);

Matthew V. Metz, Hillsboro, OR (US);

John Barnak, Portland, OR (US);

Paul R. Markworth, Hillsboro, OR (US);

Inventors:

Justin K. Brask, Portland, OR (US);

Mark L. Doczy, Beaverton, OR (US);

Matthew V. Metz, Hillsboro, OR (US);

John Barnak, Portland, OR (US);

Paul R. Markworth, Hillsboro, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L021/302 ; H01L021/461 ;
U.S. Cl.
CPC ...
Abstract

A high-K thin film patterning solution is disclosed to address structural and process limitations of conventional patterning techniques. Subsequent to formation of gate structures adjacent a high-K dielectric layer, a portion of the high-K dielectric layer material is reduced, preferably via exposure to hydrogen gas, to form a reduced portion of the high-K dielectric layer. The reduced portion may be selectively removed utilizing wet etch chemistries to leave behind a trench of desirable geometric properties.


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