The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6734101 B1

PDF
Full Text
Expired
Date of Patent:
May. 11, 2004

Filed:

Oct. 31, 2001
Applicant:
Inventors:

Tien-I Bao, Hsin-chu, TW;

Jeng Shwang-Ming, Hsin-chu, TW;

Syun-Ming Jang, Hsin-Chu, TW;

Chen-Hua Yu, Hsin-chu, TW;

Kuen-Chyr Lee, Hsin-chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/14763 ;
U.S. Cl.
CPC ...
H01L 2/14763 ;
Abstract

A new method of reducing copper hillocks in copper metallization is described. An opening is made through a dielectric layer overlying a substrate on a wafer. A copper layer is formed overlying the dielectric layer and completely filling the opening. The copper layer is polished back to leave the copper layer only within the opening. Copper hillocks are reduced by: coating an oxide layer over the copper layer and the dielectric layer, thereafter heating the wafer using NH plasma, and thereafter depositing a capping layer overlying the oxide layer wherein the time lapse between polishing back the copper layer and depositing the capping layer is less than one day (24 hours).


Find Patent Forward Citations

Bao, Tien-I. (2004). Solution to the problem of copper hillocks (U.S. Patent No. 6734101). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6734101

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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