The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2004

Filed:

May. 13, 2002
Applicant:
Inventors:

Chih-Wei Chang, Hsin-Chu, TW;

Fa-Yuan Chang, Taipei, TW;

Cheng-Ting Tseng, Hsin-Chu, TW;

Chin-Chang Chen, Shinjuang, TW;

Cheng-Cheng Chang, Hsin-Chu, TW;

Shih-Fang Chen, Sanchung Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F25B 2/102 ; H01L 3/534 ;
U.S. Cl.
CPC ...
F25B 2/102 ; H01L 3/534 ;
Abstract

A wafer transfer system having a temperature control apparatus. The temperature control apparatus is constructed and arranged so that a material, element, or atomic particle may flow therethrough to heat or cool a wafer carried by the wafer transfer system. The material, element or atomic particle flowing through the temperature control apparatus causes heat to be pumped to or from an upper surface or lower surface. Preferably the temperature control apparatus is a thermoelectric device. Preferably the thermoelectric device includes a plurality of alternating N-type and P-type semiconductor pellets arranged electrically in series and thermally in parallel, and connected to a DC power supply. A switch or relay is provided for altering the direction of current flow to the thermoelectric device from a DC supply.


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