The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2003

Filed:

Dec. 08, 1998
Applicant:
Inventors:

Steven J. Keating, Beaverton, OR (US);

Robert S. Chau, Aloha, OR (US);

Reza Arghavani, Aloha, OR (US);

Jack T. Kavalieros, Portland, OR (US);

Douglas W. Barlage, Beaverton, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/14763 ; H01L 2/131 ; H01L 3/1119 ; H01L 2/976 ; H01L 2/358 ;
U.S. Cl.
CPC ...
H01L 2/14763 ; H01L 2/131 ; H01L 3/1119 ; H01L 2/976 ; H01L 2/358 ;
Abstract

A method of forming a dielectric layer suitable for use as the gate dielectric layer in a MOSFET includes passivating the surface of a semiconductor substrate at a temperature less than approximately 80° C. and nitridizing the passivation layer. In particular embodiments, passivating a silicon wafer includes forming a hydroxy-silicate layer at approximately 24° C. In a further aspect of the present invention, an integrated circuit includes a plurality of insulated gate field effect transistors, wherein various ones of the plurality of transistors have gate dielectric layers of the nitridized passivation layer.


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