The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 02, 2003

Filed:

Mar. 14, 2001
Applicant:
Inventors:

Yeow Kheng Lim, Singapore, SG;

Randall Cher Liang Cha, Singapore, SG;

Alex See, Singapore, SG;

Tae Jong Lee, Orlando, FL (US);

Wang Ling Goh, Singapore, SG;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/130 ; H01L 2/146 ;
U.S. Cl.
CPC ...
H01L 2/130 ; H01L 2/146 ;
Abstract

A method to form SOI devices using wafer bonding. A first substrate is provided having trenches in a first side. A first insulating layer is formed over the first side of the first substrate and filling the trenches. We planarize the first insulating layer to form isolation regions (e.g., STI). The three embodiments of the invention planarize the first insulating layer to different levels. In the second embodiment, the first insulating layer is etched back to form a recess. This recess later forms an air gap. We provide a second substrate having a second insulating layer over a first side of the second substrate. We bond the second insulating layer to the first insulating layer. Next, we thin the first substrate from the second side to expose the first insulating layer to form active areas between the isolation regions. Lastly, devices are formed in and on the active areas.


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