The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2000

Filed:

Jun. 19, 1996
Applicant:
Inventors:

Ricardo Alves Donaton, Heverlee, BE;

Karen Irma Maex, Herent, BE;

Rita Verbeeck, Rotselaar, BE;

Philippe Jansen, Olen, BE;

Rita Rooyackers, Leuven, BE;

Ludo Deferm, Beverloo, BE;

Mikhail Rodionovich Baklanov, Leuven, BE;

Assignee:

IMEC VZW, Leuven, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438301 ; 438586 ; 438604 ; 438683 ;
Abstract

The present invention relates to methods for controlling the etching rate of CoSi.sub.2 layers by adjusting the pH of an HF-based solution to obtain the desired etch rate. The pH of the HF-based solution may be adjusted by adding pH modifying chemicals to the solution. A further aspect of the invention is an improved method for manufacturing Schottky barrier infared detectors employing the controlled etching step. A method for reducing drain induced barrier lowering in an active transistor having a small gate length is also provided.


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Donaton, Ricardo. (2000). Etching process of cosi.sub.2 layers (U.S. Patent No. 6153484). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6153484

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