The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 14, 1999
Filed:
Aug. 22, 1997
Leland R Nevill, Boise, ID (US);
Ray Beffa, Boise, ID (US);
Ken Waller, Garland, TX (US);
Eugene H Cloud, Boise, ID (US);
Warren M Farnworth, Nampa, ID (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
A method of testing a memory array is disclosed, the method comprising writing a test pattern to the memory array in as few as one or two RAS cycles by first activating the input/output data lines and then selectively activating multiple rows and columns. The method can be used with a variety of test environments. For example, the disclosed method may be implemented in testing using automated test equipment, and may also be incorporated in devices having built-in self-test circuitry. The disclosed method reduces the time required to test the memory array with minimal additional circuitry and no encroachment on valuable die real estate.