The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 28, 1989

Filed:

Feb. 02, 1987
Applicant:
Inventors:

Masahiro Moniwa, Hachioji, JP;

Masanobu Miyao, Tokorozawa, JP;

Shoji Shukuri, Koganei, JP;

Eiichi Murakami, Kokubunji, JP;

Terunori Warabisako, Tokyo, JP;

Masao Tamura, Tokorozawa, JP;

Nobuyoshi Natsuaki, Higashiyamato, JP;

Kiyonori Ohyu, Hachioji, JP;

Tadashi Suzuki, Kokubunji, JP;

Yuuichi Madokoro, Kokubunji, JP;

Yasuo Wada, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
437 41 ; 148D / ; 148D / ; 148D / ; 148D / ; 156603 ; 357-4 ; 357 41 ; 437 59 ; 437 62 ; 437 82 ; 437 89 ; 437101 ; 437174 ; 437963 ; 437973 ;
Abstract

Of an amorphous Si film, a region to be formed into a lowly doped region such as the channel region of an MOS transistor is covered with a mask and an uncovered region is doped with an impurity. After this, the amorphous Si film is annealed and turned to signal crystal through solid phase epitaxial growth, and the mask itself is used as the electrode of a semiconductor device. By this impurity doping, a large-sized single-crystal Si film can be formed, and the impurity doping can be conducted in self-alignment with the electrode formation to produce a highly integrated semiconductor circuit.


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