The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Oct. 28, 2022
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Chandrani Roy Chowdhury, Belmont, CA (US);

Sanjiv Mittal, Fremont, CA (US);

James Henry Gardner, Jr., Santa Cruz, CA (US);

Mohana Roy Chowdhury, Bangalore, IN;

Sachin Dangayach, San Jose, CA (US);

Victor Rotion D'souza, San Jose, CA (US);

Rajesh Kumar Singal, Mountain House, CA (US);

Rajesh Naidu Penagalapati, San Jose, CA (US);

Priyanka Jain, Nagpur, IN;

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/88 (2006.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G01N 21/8851 (2013.01); G06V 10/764 (2022.01); G01N 2021/8861 (2013.01); G06T 2207/20081 (2013.01);
Abstract

A method includes obtaining, by a processing device, data indicative of locations of defects of a substrate. The method further includes generating an image indicating the locations of the defects. The method further includes providing the image indicating the locations of the defects to a trained machine learning model. The method further includes obtaining, as output from the trained machine learning model, a classification of the locations of the defects. The method further includes performing a corrective action in view of the output from the trained machine learning model.


Find Patent Forward Citations

Roy Chowdhury, Chandrani. (2026). Classification of defect patterns of substrates (U.S. Patent No. 12743765). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12743765

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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