This inventor holds 1 USPTO granted patent. Top assignee: Applied Materials, Inc.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Priyanka Jain: Inventor in Substrate Defect Classification.
Introduction
Priyanka Jain is an inventor based in Nagpur, India. Her work includes a patent application focused on classifying substrate defect patterns using machine learning.
Latest Patents
Jain is associated with 1 patent, titled “Classification of Defect Patterns of Substrates.” The method obtains data about defect locations on a substrate and generates an image showing those locations. A trained machine learning model classifies the defect patterns from the image, and the resulting classification informs a corrective action.
Career Highlights
Jain is associated with Applied Materials, Inc. Her patent work addresses the use of machine learning to interpret substrate defects and support corrective measures.
Collaborations
Her listed coworkers include Chandrani Roy Chowdhury and Sanjiv Mittal.
Conclusion
Priyanka Jain’s patent work combines substrate defect imaging and machine learning classification to guide corrective action.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile