This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Applied Materials, Inc.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: James Henry Gardner, Jr.: Inventor in Substrate Defect Classification.
Introduction
James Henry Gardner, Jr. is an inventor based in Santa Cruz, California. His work includes a patent for using machine learning to classify patterns of defects on substrates.
Latest Patents
Gardner is associated with 1 patent, titled “Classification of Defect Patterns of Substrates.” The method obtains data about defect locations on a substrate, generates an image of those locations, and provides the image to a trained machine-learning model. The model classifies the defect locations, and the method uses that output to guide a corrective action.
Career Highlights
Gardner is associated with Applied Materials, Inc., a company whose work includes technologies for manufacturing semiconductor and other advanced materials. His patent describes applying machine learning to substrate inspection and corrective processes.
Collaborations
The listed coworkers associated with Gardner include Sanjiv Mittal and Chandrani Roy Chowdhury.
Conclusion
James Henry Gardner, Jr.’s patent addresses the use of machine learning to classify substrate defect patterns and inform corrective action.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile