Rajesh Kumar Singal

Title: Rajesh Kumar Singal and Machine-Learning-Based Defect Classification

Introduction

Rajesh Kumar Singal is an inventor based in Mountain House, California, and is associated with Applied Materials, Inc. His work includes a patented method for classifying substrate defect patterns using machine learning.

Latest Patents

Singal is credited with 1 patent, titled “Classification of Defect Patterns of Substrates.” The method obtains data about defect locations on a substrate, generates an image showing those locations, and provides the image to a trained machine-learning model. The model classifies the defect locations, and the method uses its output to guide a corrective action.

Career Highlights

Singal’s patent describes applying machine learning to substrate inspection and defect analysis. By connecting defect-location data with classification and corrective action, the method outlines a process for using model output to inform responses to detected patterns.

Collaborations

Singal’s listed coworkers include Chandrani Roy Chowdhury and Sanjiv Mittal. His company affiliation is Applied Materials, Inc.

Conclusion

Rajesh Kumar Singal’s patent focuses on machine-learning-assisted classification of substrate defects and the use of those classifications to support corrective action.