The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2026

Filed:

Oct. 11, 2024
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Mustafa N. Kaynak, San Diego, CA (US);

Mariano Burich, San Diego, CA (US);

Eyal En Gad, Fremont, CA (US);

Patrick R. Khayat, San Diego, CA (US);

Sivagnanam Parthasarathy, Carlsbad, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 11/106 (2013.01); G06F 11/1016 (2013.01); G06F 11/1068 (2013.01);
Abstract

A system and method are disclosed for decoding hard data from a memory device. For example, a controller performs a read operation to receive hard data from the memory device. The controller converts the hard data into soft information. The controller can decode using a first decoder for a first number of decoding iterations based on the soft information. An error vector indicating which bits of the hard data have been flipped by the first decoder can be generated by the controller based on a current state of a codeword for a respective decoding iteration of the first number of decoding iterations. The controller can decode using a second decoder to correct errors in the hard data for a second number of decoding iterations based on the error vector and the original hard data. The controller can provide corrected data in response to correcting the errors in the hard data.


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