The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Jul. 09, 2021
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Cai-Ling Wu, Hsinchu, TW;

Hsiu-Wen Hsueh, Taichung City, TW;

Chii-Ping Chen, Hsinchu City, TW;

PO-Hsiang Huang, Taipei City, TW;

Chi-Feng Lin, Hsinchu City, TW;

Neng-Jye Yang, Hsinchu City, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 21/3213 (2006.01); H01L 23/522 (2006.01); H01L 23/532 (2006.01); H10P 50/26 (2026.01); H10W 20/00 (2026.01); H10W 20/41 (2026.01); H10W 20/42 (2026.01); H10W 20/46 (2026.01); H10W 20/48 (2026.01);
U.S. Cl.
CPC ...
H10W 20/069 (2026.01); H10P 50/267 (2026.01); H10W 20/062 (2026.01); H10W 20/063 (2026.01); H10W 20/072 (2026.01); H10W 20/081 (2026.01); H10W 20/098 (2026.01); H10W 20/42 (2026.01); H10W 20/425 (2026.01); H10W 20/46 (2026.01); H10W 20/48 (2026.01);
Abstract

The present disclosure provides a method of forming an interconnect structure. The method includes forming a metal layer over a substrate, the metal layer including a first metal; forming a capping layer on the metal layer; patterning the capping layer and the metal layer, thereby forming trenches in the metal layer; depositing a first dielectric layer in the trenches; removing the capping layer, resulting in the first dielectric layer protruding from a top surface of the metal layer; depositing a second dielectric layer over the first dielectric layer and the metal layer; forming an opening in the second dielectric layer, thereby partially exposing the top surface of the metal layer; and forming a conductive feature in the opening and in electrical coupling with the metal layer, the conductive feature including a second metal.


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