The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Mar. 04, 2025
Powerchip Semiconductor Manufacturing Corporation, Hsinchu, TW;
Ke-Fen Chen, Hsinchu, TW;
Yu-Chih Lin, Hsinchu, TW;
Lin-Ho Ko, Hsinchu, TW;
PO-Yang Chen, Hsinchu, TW;
Powerchip Semiconductor Manufacturing Corporation, Hsinchu, TW;
Abstract
A wafer optical inspection system, including an image capturing device, which consists of a photosensitive device, an LED source and a laser source. The LED source generates a reflective feature at the edge of a batch wafers, and the laser source generates a contour feature at the edge of the batch wafers. The photosensitive device captures a wafer image alongside with the reflective feature and the contour feature to form a side image of the wafer group. An image recognition device identifies the number of wafers and their positions in the batch based on the side image of the wafer group.