Lin-Ho Ko

Title: Lin-Ho Ko: Inventor in Semiconductor Wafer Inspection.

Introduction

Lin-Ho Ko is an inventor based in Hsinchu, Taiwan. His work includes a patented optical inspection system designed to identify wafers and their positions within a batch.

Latest Patents

Ko is associated with 1 patent, titled “Wafer Optical Inspection System and Inspection Method.” The system uses an image-capturing device with a photosensitive device, an LED source, and a laser source. The LED creates a reflective feature at the edge of a batch of wafers, while the laser creates a contour feature. The photosensitive device captures these features alongside the wafer image to form a side image of the wafer group. An image-recognition device then uses that image to determine the number and positions of the wafers.

Career Highlights

Ko works at Powerchip Semiconductor Manufacturing Corporation. His patented system addresses wafer inspection by combining optical features with image recognition to assess wafers in a batch.

Collaborations

Ko’s listed coworkers include Ke-Fen Chen and Yu-Chih Lin.

Conclusion

Lin-Ho Ko’s patent describes an optical inspection approach for identifying wafer counts and positions, reflecting his work in semiconductor manufacturing technology.