This inventor holds 1 USPTO granted patent. Top assignee: Powerchip Semiconductor Manufacturing Corporation. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Ke-Fen Chen: Advancing Wafer Optical Inspection
Introduction
Ke-Fen Chen is an inventor based in Hsinchu, Taiwan. His work includes a patented optical inspection system designed to identify wafers and their positions within a batch.
Latest Patents
Chen is associated with 1 patent, titled “Wafer Optical Inspection System and Inspection Method.” The system uses an image-capturing device with a photosensitive device, an LED source, and a laser source. The LED creates a reflective feature at the edge of a batch of wafers, while the laser creates a contour feature. The photosensitive device captures these features in a side image of the wafer group, and an image-recognition device uses that image to determine the number and positions of the wafers.
Career Highlights
Chen works at Powerchip Semiconductor Manufacturing Corporation. His patented system addresses wafer inspection by combining optical features and image recognition to assess wafers in a batch.
Collaborations
Chen’s listed coworkers include Yu-Chih Lin and Lin-Ho Ko.
Conclusion
Ke-Fen Chen’s patent reflects an approach to semiconductor manufacturing inspection that uses optical imaging and image recognition to identify wafers and their positions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile