This inventor holds 1 USPTO granted patent. Top assignee: Powerchip Semiconductor Manufacturing Corporation. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Yu-Chih Lin and Wafer Optical Inspection
Introduction
Yu-Chih Lin is an inventor based in Hsinchu, Taiwan. His patent work concerns optical inspection technology for semiconductor wafers.
Latest Patents
The provided information lists one patent for Lin: “Wafer Optical Inspection System and Inspection Method.” The system uses an image-capturing device with a photosensitive device, an LED source, and a laser source. The LED creates a reflective feature at the edge of a batch of wafers, while the laser creates a contour feature. The photosensitive device captures a side image containing the wafer group and both features. An image-recognition device then uses that image to identify the number and positions of the wafers in the batch. Lin is credited with 1 patent.
Career Highlights
Lin is associated with Powerchip Semiconductor Manufacturing Corporation. His listed patent addresses wafer inspection and image recognition, supporting the identification and positioning of wafers in a batch.
Collaborations
The provided information names Ke-Fen Chen and Lin-Ho Ko as Lin’s coworkers. It does not specify their roles in the patent or describe particular collaborations.
Conclusion
Yu-Chih Lin’s listed invention combines optical features and image recognition to determine wafer counts and positions, reflecting his work in semiconductor inspection technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile