The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Dec. 27, 2022
Applicant:

Yangtze Memory Technologies Co., Ltd., Wuhan, CN;

Inventors:

Zhen Guo, Wuhan, CN;

Bin Yuan, Wuhan, CN;

Zongke Xu, Wuhan, CN;

Jiajia Wu, Wuhan, CN;

Beibei Li, Wuhan, CN;

Xiangning Wang, Wuhan, CN;

Zhu Yang, Wuhan, CN;

Qiangwei Zhang, Wuhan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 23/532 (2006.01); H01L 23/535 (2006.01); H10B 43/50 (2023.01); H10B 41/50 (2023.01);
U.S. Cl.
CPC ...
H01L 21/76895 (2013.01); H01L 21/76805 (2013.01); H01L 23/53257 (2013.01); H01L 23/535 (2013.01); H10B 43/50 (2023.02); H10B 41/50 (2023.02);
Abstract

A method of fabricating a three-dimensional memory includes forming a laminated structure including stacked dummy gate layers and interlayer insulation layers on one side of a substrate. The respective adjacent dummy gate layers and interlayer insulation layers form staircase stairs. At least a part of the interlayer insulation layer of each of the staircase stairs is exposed. The method also includes forming a buffer layer covering the staircase stairs. The method further includes removing a part of the buffer layer covering the sidewalls of the staircase stairs to form spacing grooves. The method further includes forming a dielectric layer that fills the spacing grooves and covers the staircase stairs. The method further includes forming a contact hole penetrating through the dielectric layer and the buffer layer and extending to the dummy gate layer farthest from the substrate.


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