The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
May. 23, 2024
Fudan University, Shanghai, CN;
Xiangchao Zhang, Shanghai, CN;
Yunuo Chen, Shanghai, CN;
Wei Lang, Shanghai, CN;
Sihan Chen, Shanghai, CN;
Chengzhuo Wang, Shanghai, CN;
FUDAN UNIVERSITY, Shanghai, CN;
Abstract
The invention relates to precision measurement technology, specifically a high-sensitivity three-dimensional topography recovery method using dual-channel differentiation. Enhancing a traditional microscopic imaging system, a beam splitter is added between the objective lens and tube lens. This creates an additional light path equipped with a tube lens and camera identical to the original but with a slightly different distance to the camera. During axial scanning of the object, focusing evaluation function curves for each pixel are calculated from images captured by both cameras. The curves from the two cameras show more significant changes near the optimal focusing depth, improving system sensitivity. This method enhances sensitivity by hardware-fixed differentiation of the focusing evaluation function, while maintaining high scanning efficiency and flexible configuration.