Yunuo Chen

Title: Innovations of Yunuo Chen in Precision Measurement Technology

Introduction

Yunuo Chen is a notable inventor based in Shanghai, China. He has made significant contributions to the field of precision measurement technology. His innovative approach has led to advancements that enhance the capabilities of traditional microscopic imaging systems.

Latest Patents

Yunuo Chen holds a patent for a high-sensitivity three-dimensional topography recovery method based on dual-channel differentiation. This invention improves the sensitivity of traditional microscopic imaging systems by incorporating a beam splitter between the objective lens and tube lens. The method allows for the creation of an additional light path equipped with a tube lens and camera, which is crucial for capturing images with enhanced focus. The axial scanning of the object enables the calculation of focusing evaluation function curves for each pixel, leading to improved system sensitivity.

Career Highlights

Yunuo Chen is affiliated with Fudan University, where he continues to engage in research and development in his field. His work has garnered attention for its innovative approach to enhancing imaging systems. With a focus on precision measurement technology, he has established himself as a key figure in advancing this area of research.

Collaborations

Yunuo Chen collaborates with esteemed colleagues, including Xiangchao Zhang and Wei Lang. Their combined expertise contributes to the ongoing development of innovative solutions in precision measurement technology.

Conclusion

Yunuo Chen's contributions to precision measurement technology through his innovative patent demonstrate his commitment to advancing the field. His work not only enhances traditional imaging systems but also paves the way for future innovations.