Xiangchao Zhang

Title: Xiangchao Zhang: Innovator in Precision Measurement Technology

Introduction

Xiangchao Zhang is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of precision measurement technology. His innovative approach has led to advancements in three-dimensional topography recovery methods.

Latest Patents

Xiangchao Zhang holds a patent for a high-sensitivity three-dimensional topography recovery method based on dual-channel differentiation. This invention enhances traditional microscopic imaging systems by incorporating a beam splitter between the objective lens and tube lens. The addition creates an extra light path equipped with a tube lens and camera, which is slightly distanced from the original setup. During axial scanning, focusing evaluation function curves for each pixel are calculated from images captured by both cameras. The curves exhibit more significant changes near the optimal focusing depth, thereby improving system sensitivity. This method enhances sensitivity through hardware-fixed differentiation of the focusing evaluation function while maintaining high scanning efficiency and flexible configuration.

Career Highlights

Xiangchao Zhang is affiliated with Fudan University, where he continues to engage in research and development in his field. His work has garnered attention for its innovative approach and practical applications in precision measurement.

Collaborations

Xiangchao Zhang collaborates with notable colleagues, including Yunuo Chen and Wei Lang. Their combined expertise contributes to the advancement of technology in their respective fields.

Conclusion

Xiangchao Zhang is a key figure in the realm of precision measurement technology, with a focus on enhancing three-dimensional topography recovery methods. His contributions are paving the way for future innovations in this critical area of research.