Wei Lang

Title: Innovations of Wei Lang in Precision Measurement Technology

Introduction

Wei Lang is an accomplished inventor based in Shanghai, China. He has made significant contributions to the field of precision measurement technology. His innovative approach has led to the development of a high-sensitivity three-dimensional topography recovery method.

Latest Patents

Wei Lang holds a patent for a method titled "High-sensitivity three-dimensional topography recovery method based on dual-channel differentiation." This invention enhances traditional microscopic imaging systems by incorporating a beam splitter between the objective lens and tube lens. The addition creates an extra light path equipped with a tube lens and camera, which is similar to the original setup but with a slightly different distance to the camera. During axial scanning of the object, focusing evaluation function curves for each pixel are calculated from images captured by both cameras. The curves from the two cameras exhibit more significant changes near the optimal focusing depth, thereby improving system sensitivity. This method enhances sensitivity through hardware-fixed differentiation of the focusing evaluation function while maintaining high scanning efficiency and flexible configuration. Wei Lang has 1 patent to his name.

Career Highlights

Wei Lang is affiliated with Fudan University, where he continues to advance his research and innovations in measurement technology. His work has garnered attention for its practical applications and contributions to the scientific community.

Collaborations

Wei Lang collaborates with notable colleagues, including Xiangchao Zhang and Yunuo Chen. Their combined expertise fosters a productive research environment that encourages innovation.

Conclusion

Wei Lang's contributions to precision measurement technology exemplify the impact of innovative thinking in scientific research. His patented method showcases the potential for advancements in microscopic imaging systems.