Sihan Chen

Title: Sihan Chen: Innovator in Precision Measurement Technology

Introduction

Sihan Chen is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of precision measurement technology. His innovative approach has led to the development of a unique method that enhances the sensitivity of microscopic imaging systems.

Latest Patents

Sihan Chen holds a patent for a "High-sensitivity three-dimensional topography recovery method based on dual-channel differentiation." This invention focuses on improving traditional microscopic imaging systems by incorporating a beam splitter between the objective lens and tube lens. This addition creates an additional light path equipped with a tube lens and camera, which allows for more accurate measurements. The method calculates focusing evaluation function curves for each pixel from images captured by both cameras, resulting in improved system sensitivity.

Career Highlights

Sihan Chen is affiliated with Fudan University, where he continues to advance research in precision measurement technology. His work has garnered attention for its innovative approach and practical applications in various fields.

Collaborations

Sihan Chen collaborates with notable colleagues, including Xiangchao Zhang and Yunuo Chen. Their combined expertise contributes to the advancement of research and development in their respective areas.

Conclusion

Sihan Chen's contributions to precision measurement technology exemplify the impact of innovative thinking in scientific research. His patented method not only enhances imaging systems but also sets a new standard for sensitivity in precision measurements.