The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2025

Filed:

Jul. 21, 2023
Applicant:

Sandisk Technologies, Inc., Milpitas, CA (US);

Inventors:

Abu Naser Zainuddin, Milpitas, CA (US);

Parth Amin, Livermore, CA (US);

Xiaochen Zhu, Milpitas, CA (US);

Jiahui Yuan, Fremont, CA (US);

Anubhav Khandelwal, San Jose, CA (US);

Vishwanath Basavaegowda Shanthakumar, Milpitas, CA (US);

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 16/10 (2006.01); G11C 16/04 (2006.01); G11C 16/16 (2006.01); G11C 16/34 (2006.01); H01L 25/065 (2023.01);
U.S. Cl.
CPC ...
G11C 16/10 (2013.01); G11C 16/0483 (2013.01); G11C 16/16 (2013.01); G11C 16/3459 (2013.01); H01L 25/0657 (2013.01); H01L 2225/06562 (2013.01);
Abstract

A duration of a program pulse used to program non-volatile memory cells such as NAND may be increased responsive to a programming failure using a shorter duration program pulse. The duration of at least one program pulse may be increased for at least one group of memory cells in response to a failure to program a group using a default program pulse duration. The group that experiences the increased duration program pulse may be the same group for which the program operation failed using the shorter program pulse or may be a different group than the group for which the program operation failed using the shorter program pulse.


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