The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2025

Filed:

May. 13, 2022
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Chen-Shien Chen, Zhubei, TW;

Ting-Hao Kuo, Hsinchu, TW;

Hsu-Hsien Chen, Hsinchu, TW;

Yu-Chih Huang, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H01L 21/683 (2006.01); H01L 23/00 (2006.01); H01L 25/00 (2006.01); H01L 25/10 (2006.01); H01L 23/48 (2006.01);
U.S. Cl.
CPC ...
H01L 22/20 (2013.01); H01L 21/6835 (2013.01); H01L 22/34 (2013.01); H01L 24/03 (2013.01); H01L 24/11 (2013.01); H01L 24/96 (2013.01); H01L 25/105 (2013.01); H01L 25/50 (2013.01); H01L 23/481 (2013.01); H01L 24/05 (2013.01); H01L 24/06 (2013.01); H01L 24/13 (2013.01); H01L 2221/68327 (2013.01); H01L 2224/03452 (2013.01); H01L 2224/037 (2013.01); H01L 2224/0401 (2013.01); H01L 2224/0557 (2013.01); H01L 2224/05647 (2013.01); H01L 2224/05686 (2013.01); H01L 2224/06181 (2013.01); H01L 2224/06505 (2013.01); H01L 2224/117 (2013.01); H01L 2224/13082 (2013.01); H01L 2224/80006 (2013.01); H01L 2224/80201 (2013.01); H01L 2224/80379 (2013.01); H01L 2224/80895 (2013.01); H01L 2224/80896 (2013.01); H01L 2224/80905 (2013.01); H01L 2224/80948 (2013.01); H01L 2224/95001 (2013.01); H01L 2224/96 (2013.01);
Abstract

A method of forming a semiconductor package includes attaching a first package component to a first carrier; attaching a second package component to the first carrier, the second package component laterally displaced from the first package component; attaching a third package component to the first package component, the third package component being electrically connected to the first package component; removing the first carrier from the first package component and the second package component; after removing the first carrier, performing a first circuit probe test on the second package component to obtain first test data of the second package component; and comparing the first test data of the second package component with prior data of the second package component.


Find Patent Forward Citations

Loading…