The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 19, 2025

Filed:

May. 14, 2024
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Shih-Jui Huang, Hsinchu, TW;

Shinan Ku, Hsinchu, TW;

Ting-Hao Hsu, Hsinchu, TW;

Hsin-Chang Lee, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2006.01); G03F 1/66 (2012.01); G03F 1/82 (2012.01);
U.S. Cl.
CPC ...
G03F 7/70608 (2013.01); G03F 1/66 (2013.01); G03F 1/82 (2013.01); G03F 7/70491 (2013.01); G03F 7/70741 (2013.01); G03F 7/7085 (2013.01); G03F 7/70925 (2013.01);
Abstract

A method of inspecting an outer surface of a mask pod includes moving a stage holding a mask pod such that the stage stops at each location of a plurality of locations under an outer surface of the mask pod for a predefined amount of time. At each location of the plurality of locations, the method further includes directing a stream of air to the outer surface of the mask pod, capturing an image of scattered air from each location of the plurality of locations of the outer surface of the mask pod, and determining a number of particles in the scattered air as a sampled number of particles based on the captured image. The method also includes generating a map of particles on the outer surface of the mask pod based on the sampled number of particles at each of the plurality of locations.


Find Patent Forward Citations

Huang, Shih-Jui. (2025). High throughput and high position accurate method for particle inspection of mask pods (U.S. Patent No. 12393124). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12393124

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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