The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 2025
Filed:
May. 14, 2024
China University of Petroleum (East China), Qingdao, CN;
Wei Li, Shandong, CN;
Xin'an Yuan, Shandong, CN;
Xiaokang Yin, Shandong, CN;
Jianming Zhao, Shandong, CN;
Xiao Li, Shandong, CN;
Jianchao Zhao, Shandong, CN;
Jianxi Ding, Shandong, CN;
Han Wang, Shandong, CN;
Qinyu Chen, Shandong, CN;
Dong Hu, Shandong, CN;
Wenbin Wang, Shandong, CN;
Xihe Zhang, Shandong, CN;
Xiangyang Wang, Shandong, CN;
CHINA UNIVERSITY OF PETROLEUM (EAST CHINA), Shandong, CN;
Abstract
Provided are an alternating current field based defect identification method and an array detection probe. The evaluation method includes the following steps: obtaining a magnetic field Bx signal in direction X and a magnetic field Bz signal in direction Z; removing a background magnetic field of each of the magnetic field Bx signal in the direction X and the magnetic field Bz signal in the direction Z, and obtaining a magnetic field Bxsignal in the direction X and a magnetic field Bzsignal in the direction Z without background magnetic fields; drawing an array image of the Bxsignal and an array image of the Bzsignal; and locating a distortion zone corresponding to disturbance at the same time and position in the array image of the Bxsignal and the array image of the Bzsignal.