This inventor holds 1 USPTO granted patent. Top assignee: China University of Petroleum (East China). Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Jianxi Ding: Innovator in Defect Identification Technology
Introduction
Jianxi Ding is a notable inventor based in Shandong, China. He has made significant contributions to the field of defect identification technology. His innovative approach has led to the development of a unique method and device that enhances the accuracy of defect detection.
Latest Patents
Jianxi Ding holds a patent for a "Defect identification method, and array detection probe." This invention provides an alternating current field-based defect identification method and an array detection probe. The evaluation method includes several steps: obtaining a magnetic field Bx signal in direction X and a magnetic field Bz signal in direction Z; removing the background magnetic field from each signal; and obtaining the Bx and Bz signals without background interference. The process also involves drawing array images of these signals and locating distortion zones corresponding to disturbances in the array images.
Career Highlights
Jianxi Ding is affiliated with the China University of Petroleum, where he continues to advance his research and development efforts. His work has garnered attention for its practical applications in various industries, particularly in enhancing the reliability of defect detection.
Collaborations
Jianxi Ding collaborates with esteemed colleagues, including Wei Li and Xin'an Yuan, who contribute to his research endeavors. Their combined expertise fosters an environment of innovation and discovery.
Conclusion
Jianxi Ding's contributions to defect identification technology exemplify the impact of innovative thinking in engineering. His patent and ongoing research at the China University of Petroleum highlight the importance of advancements in this field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile