Company Filing History:
Years Active: 2025
Title: Han Wang - Innovator in Defect Identification Technology
Introduction
Han Wang is a notable inventor based in Shandong, China. He has made significant contributions to the field of defect identification technology. His innovative approach has led to the development of a unique method and device that enhances the accuracy of defect detection.
Latest Patents
Han Wang holds a patent for a "Defect identification method, and array detection probe." This invention provides an alternating current field-based defect identification method and an array detection probe. The evaluation method includes several steps: obtaining a magnetic field Bx signal in direction X and a magnetic field Bz signal in direction Z; removing the background magnetic field from each signal; and obtaining the Bx and Bz signals without background interference. The process also involves drawing array images of these signals and locating distortion zones corresponding to disturbances in the array images.
Career Highlights
Han Wang is affiliated with the China University of Petroleum, where he continues to advance research in his field. His work has garnered attention for its practical applications in various industries. He has successfully developed methods that improve the reliability of defect detection, which is crucial for maintaining quality in manufacturing processes.
Collaborations
Han Wang collaborates with esteemed colleagues such as Wei Li and Xin'an Yuan. Their combined expertise contributes to the advancement of research and innovation in defect identification technologies.
Conclusion
Han Wang's contributions to defect identification technology exemplify the impact of innovative thinking in engineering. His patent and ongoing research continue to influence the field positively.