Company Filing History:
Years Active: 2025
Title: Innovations of Dong Hu in Defect Identification Technology.
Introduction
Dong Hu is a notable inventor based in Shandong, China. He has made significant contributions to the field of defect identification technology. His work focuses on enhancing the accuracy and efficiency of detecting defects in various applications.
Latest Patents
Dong Hu holds a patent for a "Defect identification method and array detection probe." This innovative method utilizes an alternating current field to identify defects. The evaluation process involves obtaining magnetic field signals in different directions, removing background magnetic fields, and drawing array images to locate distortion zones. His patent represents a significant advancement in the field of defect detection.
Career Highlights
Dong Hu is affiliated with the China University of Petroleum. His role at the university allows him to engage in cutting-edge research and development. His expertise in defect identification has positioned him as a valuable asset in his field.
Collaborations
Dong Hu collaborates with esteemed colleagues such as Wei Li and Xin'an Yuan. Their combined efforts contribute to the advancement of technology in defect identification.
Conclusion
Dong Hu's innovative work in defect identification technology showcases his commitment to improving detection methods. His contributions are vital for advancements in various industries.