Xiangyang Wang

Title: Innovations of Xiangyang Wang in Defect Identification Technology

Introduction

Xiangyang Wang is a notable inventor based in Shandong, China. He has made significant contributions to the field of defect identification technology. His innovative approach has led to the development of a unique method and device that enhances the accuracy of defect detection.

Latest Patents

Xiangyang Wang holds a patent for a "Defect identification method, and array detection probe." This invention provides an alternating current field-based defect identification method and an array detection probe. The evaluation method includes several steps: obtaining a magnetic field Bx signal in direction X and a magnetic field Bz signal in direction Z; removing the background magnetic field from each signal; and obtaining the Bx and Bz signals without background interference. The process also involves drawing array images of these signals and locating distortion zones corresponding to disturbances in both images.

Career Highlights

Xiangyang Wang is affiliated with the China University of Petroleum, where he continues to advance research in his field. His work has garnered attention for its practical applications in various industries, particularly in enhancing the reliability of defect detection methods.

Collaborations

Xiangyang Wang collaborates with esteemed colleagues such as Wei Li and Xin'an Yuan. Their combined expertise contributes to the ongoing development of innovative technologies in defect identification.

Conclusion

Xiangyang Wang's contributions to defect identification technology exemplify the impact of innovative thinking in engineering. His patent and ongoing research continue to pave the way for advancements in this critical field.