The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

May. 17, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Chun-Hung Liao, Taichung, TW;

Chung-Wei Hsu, Hsinchu County, TW;

Tsung-Ling Tsai, Hsinchu, TW;

Chen-Hao Wu, Hsinchu, TW;

An-Hsuan Lee, Hsinchu, TW;

Shen-Nan Lee, Hsinchu County, TW;

Teng-Chun Tsai, Hsinchu, TW;

Huang-Lin Chao, Hillsboro, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/3105 (2006.01); C09G 1/02 (2006.01); C09K 3/14 (2006.01); C23F 1/12 (2006.01); H01L 21/02 (2006.01); H01L 21/306 (2006.01); H01L 21/3063 (2006.01); H01L 21/311 (2006.01);
U.S. Cl.
CPC ...
H01L 21/31053 (2013.01); C09G 1/02 (2013.01); C09K 3/1409 (2013.01); C23F 1/12 (2013.01); H01L 21/02019 (2013.01); H01L 21/30625 (2013.01); H01L 21/3063 (2013.01); H01L 21/31055 (2013.01); H01L 21/31111 (2013.01);
Abstract

The present disclosure provides a method for manufacturing a semiconductor. The method includes: forming a metal oxide layer over a gate structure over a substrate; forming a dielectric layer over the metal oxide layer; forming a metal layer over the metal oxide layer; and performing a chemical mechanical polish (CMP) operation to remove a portion of the dielectric layer and a portion of the metal layer, the CMP operation stopping at the metal oxide layer, wherein a slurry used in the CMP operation includes a ceria compound. The present disclosure also provides a method for planarizing a metal-dielectric surface.


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