The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2024

Filed:

May. 30, 2023
Applicant:

Stmicroelectronics International N.v., Geneva, CH;

Inventors:

Venkata Narayanan Srinivasan, Greater Noida, IN;

Manish Sharma, Gurgaon, IN;

Jeena Mary George, Kattappana, IN;

Umesh Chandra Srivastava, Greater Noida, IN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318541 (2013.01); G01R 31/318536 (2013.01); G01R 31/318552 (2013.01); G01R 31/318555 (2013.01); G01R 31/318572 (2013.01);
Abstract

According to an embodiment, a method for testing a triple-voting flop (TVF) is provided. The method includes providing a first and a second scan enable signal by a control circuit to, respectively, a first scan flip-flop and a third scan flip-flop of the TVF; receiving a third scan enable signal at the second scan flip-flop of the TVF; providing a scan input signal to the first scan flip-flop, the second scan flip-flop, and the third scan flip-flop; controlling the first scan enable signal, the second scan enable signal, and the third scan enable signal; receiving, at an output of the TVF, a scan output signal; and determining whether the TVF suffers from a fault based on the scan output signal and the controlling of the first scan enable signal, the second scan enable signal, and the third scan enable signal.


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