The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2024

Filed:

Nov. 01, 2019
Applicant:

Acm Research (Shanghai) Inc., Shanghai, CN;

Inventors:

Wenjun Wang, Shanghai, CN;

Ting Yao, Shanghai, CN;

Xiaoyan Zhang, Shanghai, CN;

Fuping Chen, Shanghai, CN;

Hui Wang, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); B08B 3/02 (2006.01); B08B 3/04 (2006.01); B08B 3/12 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02057 (2013.01); B08B 3/022 (2013.01); B08B 3/041 (2013.01); B08B 3/12 (2013.01); H01L 21/67051 (2013.01); B08B 2220/04 (2013.01);
Abstract

A method for cleaning a substrate with pattern structures comprises the following steps: using gas-liquid atomization to clean a substrate surface (); using TEBO megasonic to clean the substrate surface (); and drying the substrate (). The TEBO megasonic cleaning is used to remove small size particles on the substrate and the gas-liquid atomization cleaning is used to remove large size particles on the substrate. The method enables achieving an effect of cleaning the substrate without or with less device damage. A substrate cleaning apparatus is also provided.


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