The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Apr. 15, 2020
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Haosheng Wu, San Jose, CA (US);

Shou-Sung Chang, Mountain View, CA (US);

Jianshe Tang, San Jose, CA (US);

Chih Chung Chou, San Jose, CA (US);

Hui Chen, San Jose, CA (US);

Hari Soundararajan, Sunnyvale, CA (US);

Benjamin Cherian, San Jose, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 57/02 (2006.01); H01L 21/304 (2006.01); B24B 37/04 (2012.01); B24B 37/015 (2012.01); B24B 37/10 (2012.01); B24B 37/22 (2012.01); B24B 37/34 (2012.01); B24B 55/02 (2006.01); B24B 53/017 (2012.01); B24B 49/14 (2006.01);
U.S. Cl.
CPC ...
B24B 57/02 (2013.01); B24B 37/015 (2013.01); B24B 37/042 (2013.01); B24B 37/105 (2013.01); B24B 37/22 (2013.01); B24B 37/34 (2013.01); B24B 55/02 (2013.01); H01L 21/304 (2013.01); B24B 49/14 (2013.01); B24B 53/017 (2013.01);
Abstract

A chemical mechanical polishing apparatus includes a platen to hold a polishing pad, a carrier laterally movable by an actuator across the polishing pad to hold a substrate against a polishing surface of the polishing pad during a polishing process, a thermal control system including a plurality of independently controllable heaters and coolers to independently control temperatures of a plurality of zones on the polishing pad, and a controller configured to cause the thermal control system to generate a first zone having a first temperature and a second zone having a different second temperature on the polishing pad.


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