The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2023

Filed:

Jun. 08, 2022
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Wei-Sheng Yun, Taipei, TW;

Chih-Hao Wang, Hsinchu County, TW;

Jui-Chien Huang, Hsinchu, TW;

Kuo-Cheng Chiang, Hsinchu County, TW;

Chih-Chao Chou, Hsinchu, TW;

Chun-Hsiung Lin, Hsinchu County, TW;

Pei-Hsun Wang, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8238 (2006.01); H01L 29/06 (2006.01); H01L 21/02 (2006.01); H01L 21/324 (2006.01); H01L 29/423 (2006.01); H01L 27/092 (2006.01); H01L 29/08 (2006.01); H01L 29/10 (2006.01); H01L 21/306 (2006.01); H01L 21/311 (2006.01); H01L 21/027 (2006.01); H01L 21/762 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 21/823821 (2013.01); H01L 21/02532 (2013.01); H01L 21/30604 (2013.01); H01L 21/324 (2013.01); H01L 21/823807 (2013.01); H01L 21/823828 (2013.01); H01L 27/0924 (2013.01); H01L 29/0673 (2013.01); H01L 29/0847 (2013.01); H01L 29/1037 (2013.01); H01L 29/42392 (2013.01); H01L 21/0274 (2013.01); H01L 21/31116 (2013.01); H01L 21/76224 (2013.01); H01L 21/823864 (2013.01); H01L 21/823878 (2013.01); H01L 29/6653 (2013.01); H01L 29/66545 (2013.01);
Abstract

A semiconductor structure includes a fin disposed on a substrate, the fin including a channel region comprising a plurality of channels vertically stacked over one another, the channels comprising germanium distributed therein. The semiconductor structure further includes a gate stack engaging the channel region of the fin and gate spacers disposed between the gate stack and the source and drain regions of the fin, wherein each channel of the channels includes a middle section wrapped around by the gate stack and two end sections engaged by the gate spacers, wherein a concentration of germanium in the middle section of the channel is higher than a concentration of germanium in the two end sections of the channel, and wherein the middle section of the channel further includes a core portion and an outer portion surrounding the core portion with a germanium concentration profile from the core portion to the outer portion.


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