The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2023

Filed:

Jun. 27, 2019
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

An-Hsuan Lee, Hsinchu, TW;

Ming-Shiuan She, Taoyuan, TW;

Chen-Hao Wu, Taichung, TW;

Chun-Hung Liao, Taichung, TW;

Shen-Nan Lee, Hsinchu County, TW;

Teng-Chun Tsai, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08J 9/26 (2006.01); B24B 37/24 (2012.01); B32B 3/10 (2006.01); B32B 3/12 (2006.01); C09G 1/02 (2006.01); B24B 37/10 (2012.01); C08L 81/06 (2006.01); C08L 75/04 (2006.01); C08L 77/00 (2006.01); C08L 53/00 (2006.01); B32B 5/00 (2006.01);
U.S. Cl.
CPC ...
B24B 37/24 (2013.01); B24B 37/107 (2013.01); B32B 3/10 (2013.01); B32B 3/12 (2013.01); C08J 9/26 (2013.01); C09G 1/02 (2013.01); B32B 5/00 (2013.01); C08L 53/00 (2013.01); C08L 75/04 (2013.01); C08L 77/00 (2013.01); C08L 81/06 (2013.01);
Abstract

A method of forming a CMP pad includes providing a solution of a block copolymer (BCP), where the BCP includes a first segment and a second segment connected to the first segment, the second segment being different from the first segment in composition. The method further includes processing the BCP to form a polymer network having a first phase and a second phase embedded in the first phase, where the first phase includes the first segment and the second phase includes the second segment, and subsequently removing the second phase from the polymer network, thereby forming a polymer film that includes a network of pores embedded in the first phase. Thereafter, the method proceeds to combining the CMP top pad and a CMP sub-pad to form a CMP pad, where the CMP top pad is configured to engage with a workpiece during a CMP process.


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