Nanowire transistors employing carbon-based layers

Abstract

Techniques are disclosed for forming nanowire transistors employing carbon-based layers. Carbon is added to the sacrificial layers and/or non-sacrificial layers of a multilayer stack forming one or more nanowires in the transistor channel region. Such carbon-based layers reduce or prevent diffusion and intermixing of the sacrificial and non-sacrificial portions of the multilayer stack. The reduction of diffusion/intermixing can allow for the originally formed layers to effectively maintain their original thicknesses, thereby enabling the formation of relatively more nanowires for a given channel region height because of the more accurate processing scheme. The techniques can be used to benefit group IV semiconductor material nanowire devices (e.g., devices including Si, Ge, and/or SiGe) and can also assist with the selective etch processing used to form the nanowires. The carbon concentration of the sacrificial and/or non-sacrificial layers can be adjusted to facilitate etch process to liberate nanowires in the channel region.