The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 25, 2022

Filed:

Feb. 27, 2019
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Cheng Xu, Chandler, AZ (US);

Junnan Zhao, Gilbert, AZ (US);

Zhimin Wan, Chandler, AZ (US);

Ying Wang, Chandler, AZ (US);

Yikang Deng, Chandler, AZ (US);

Chong Zhang, Chandler, AZ (US);

Jiwei Sun, Chandler, AZ (US);

Zhenguo Jiang, Chandler, AZ (US);

Kyu-Oh Lee, Chandler, AZ (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/46 (2006.01); H01L 23/467 (2006.01); H05K 1/18 (2006.01); H05K 1/02 (2006.01); H05K 3/32 (2006.01); H01L 23/473 (2006.01); H01L 23/66 (2006.01); H01L 23/31 (2006.01);
U.S. Cl.
CPC ...
H01L 23/46 (2013.01); H01L 23/3157 (2013.01); H01L 23/467 (2013.01); H01L 23/473 (2013.01); H01L 23/66 (2013.01); H05K 1/0204 (2013.01); H05K 1/181 (2013.01); H05K 3/32 (2013.01); H01L 2223/6677 (2013.01); H05K 2201/064 (2013.01); H05K 2201/10378 (2013.01); H05K 2201/10734 (2013.01);
Abstract

An integrated circuit package may be formed having a heat transfer fluid chamber, wherein the heat transfer fluid chamber may be positioned to allow a heat transfer fluid to directly contact an integrated circuit device within the integrated circuit package. In one embodiment, a first surface of the integrated circuit device may be electrically attached to a first substrate. The first substrate may then may be electrically attached to a second substrate, such that the integrated circuit device is between the first substrate and the second substrate. The second substrate may include a cavity, wherein the heat transfer fluid chamber may be formed between a second surface of the integrated circuit device and the cavity of the second substrate. Thus, at least a portion of a second surface of the integrated circuit device is exposed to the heat transfer fluid which flows into the heat transfer fluid chamber.


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