The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2022

Filed:

Aug. 14, 2020
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Sen-Kuei Hsu, Kaohsiung, TW;

Ching-Feng Yang, Taipei, TW;

Hsin-Yu Pan, Taipei, TW;

Kai-Chiang Wu, Hsinchu, TW;

Yi-Che Chiang, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/52 (2006.01); H01L 23/367 (2006.01); H01L 23/00 (2006.01); H01L 21/768 (2006.01); H01L 23/522 (2006.01); H01L 23/538 (2006.01);
U.S. Cl.
CPC ...
H01L 23/367 (2013.01); H01L 21/76816 (2013.01); H01L 23/5226 (2013.01); H01L 23/5384 (2013.01); H01L 23/562 (2013.01); H01L 24/17 (2013.01); H01L 24/32 (2013.01); H01L 24/18 (2013.01); H01L 24/20 (2013.01); H01L 24/23 (2013.01); H01L 24/24 (2013.01); H01L 24/25 (2013.01); H01L 2224/02379 (2013.01); H01L 2224/18 (2013.01); H01L 2224/20 (2013.01); H01L 2224/21 (2013.01); H01L 2224/2101 (2013.01); H01L 2224/211 (2013.01); H01L 2224/22 (2013.01); H01L 2224/2201 (2013.01); H01L 2224/221 (2013.01); H01L 2224/25171 (2013.01); H01L 2924/15172 (2013.01); H01L 2924/15173 (2013.01);
Abstract

A semiconductor package includes a die, a dummy die, a plurality of conductive terminals, an insulating layer and a plurality of thermal through vias. The dummy die is disposed aside the die. The conductive terminals are disposed at a first side of the dummy die and the die and electrically connected to the dummy die and the die. The insulating layer is disposed at a second side opposite to the first side of the dummy die and the die. The thermal through vias penetrating through the insulating layer.


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