The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 2021

Filed:

Sep. 05, 2018
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Taro Ikeda, Yamanashi, JP;

Tomohito Komatsu, Yamanashi, JP;

Yuki Osada, Yamanashi, JP;

Hiroyuki Miyashita, Yamanashi, JP;

Susumu Saito, Yamanashi, JP;

Kazuhiro Furuki, Yamanashi, JP;

Mikio Sato, Yamanashi, JP;

Eiki Kamata, Yamanashi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32935 (2013.01); H01J 37/3222 (2013.01); H01J 37/32238 (2013.01); H01J 2237/0206 (2013.01);
Abstract

A plasma probe device includes an antenna unit installed at an opening formed in a wall of a processing chamber or a mounting table through a sealing member configured to seal between a vacuum space and an atmospheric space, an electrode connected to the antenna unit, and a dielectric support portion made of a dielectric material and configured to support the antenna unit from an outer peripheral side. A surface of the antenna unit which is exposed through the opening and separated from a facing surface of the wall or the mounting table facing the antenna unit by a width is depressed from a surface of the wall or the mounting table where the opening is formed, which faces a plasma generation space.


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